BYU

Abstract by Evan Dodson

Personal Infomation


Presenter's Name

Evan Dodson

Degree Level

Undergraduate

Co-Authors

Nick Allen
Robert Davis
Spencer Roberts
Richard Vanfleet

Abstract Infomation


Department

Physics and Astronomy

Faculty Advisor

Robert Davis
Richard Vanfleet

Title

Optimizing Carbon Nanotube Growth for Circuit Transfer

Abstract

Carbon nanotubes (CNTs) are a promising material for use in electrode manufacture for human use due to their good conductance and inert nature. In this, CNTs must be removed and transferred onto a circuit and handle application stresses, making adhesion to substrate and strength important growth parameters. CNTs were grown in a chemical vapor deposition furnace with lateral dimensions from 40μm to 5000μm and infiltrated with carbon ranging from 850 - 900 C for 5 - 360 min. To test adhesion, they were subjected to a series of increasingly aggressive qualitative tests attempting to remove them from the substrate. Strength was tested through 3-point bending. It was found that over the range of sizes tested, infiltration at 850 C produced CNTs that adhered before a O2 plasma etch while 900 C infiltration adhered even after an O2 etch. CNTs that were more square generally had better adhesion strength. Strength does not seem to vary between each temperature's maximal infiltration time.