Abstract by Hoon Lee

Personal Infomation

Presenter's Name

Hoon Lee

Degree Level


Abstract Infomation


Chemistry and Biochemistry

Faculty Advisor

James Patterson


Controlling errors from laser fluctuations


Non-destructive testing (NDT) using Second Harmonic Generation (SHG) or Sum Frequency Generation (SFG) detect laser signal changes in the material that indicates chemical and morphological changes. After conducting SHG NDT in samples such as, 2024 aluminum alloy, we ran into varying sampling errors. As these sampling errors may interfere with our understanding of the properties of the materials, we plan to find the source of the signal errors. Without having a clear indication of where the sampling errors may have originated, our goal is to identify the source of signal fluctuation errors by examining the properties of the samples and the NDT methods. One of the methods that we’ve performed to successfully reduce the sampling errors is normalizing individual laser shots rather than normalizing averaged laser shots. Our aim is to generate precise and accurate data collection of the materials by reducing the sampling errors that may come from the laser fluctuation or the sample when using