Abstract by Nathan Schwartz

Personal Infomation

Presenter's Name

Nathan Schwartz

Degree Level



Spencer King
John Colton

Abstract Infomation


Physics and Astronomy

Faculty Advisor

John Colton


Characterizing Thin Films through SEM Analysis


We seek to characterize zinc arsenide and zinc oxide in both thermally evaporated and plasma sputtered form to determine its usefulness in creating stable p-type ZnO for use in optical and electrical devices. Through a thermal evaporation technique, we grow ZnAs films on glass, sapphire, and silicon nitride substrates. We then utilize a scanning electron microscope to determine the surface characteristics of our grown films.  By analyzing the correlation between p-type creation and surface roughness of the ZnAs samples, we hope to understand multiple properties of zinc arsenide including crystal structure and formation patterns. We plan to use these results to refine the growth process and consistently create ZnAs films useful for doping ZnO.