Abstract by Nick Porter

Personal Infomation

Presenter's Name

Nick Porter

Degree Level



Jarom Jackson
Richard Sandberg
Dallin Durfee

Abstract Infomation


Physics and Astronomy

Faculty Advisor

Richard Sandberg


Etalon interference laser wavelength metrology using webcams


Many fields of research require precise measurement of a laser's wavelength, but commercially available wavemeters are often too expensive, too large, or too fragile to be practical. We have designed and constructed a robust, compact, and inexpensive wavelength meter based on etalon interference—a phenomenon similar to thin-film interference. The device uses a webcam to measure the interference patterns caused by a series of etalons. Analyzing this etaloning across a range of known wavelengths provides a set of wavelength-dependent reference functions, which can be used to calculate an unknown wavelength within the same range. We present data showing that this device can measure a laser's wavelength with an average error less than a picometer, and a standard deviation less than 2 picometers.