Abstract by Logan Page

Personal Infomation

Presenter's Name

Logan Page

Degree Level


Abstract Infomation


Physics and Astronomy

Faculty Advisor

David Allred


Production and Analysis of UO¬x and ThOx Thin Films


Uranium and thorium oxides are important materials in nuclear energy production. Their thermal properties are a determining factor in their viability as nuclear fuels. To more accurately determine the thermal properties of UOx and ThOx, we are creating thin films of these substances by sputtering in a vacuum-controlled environment.

          I have conducted analysis of the composition and properties of the produced thin films via ellipsometry and X-ray diffraction. Here I will present the results of the X-ray diffraction for UOx samples and their indications with respect to stoichiometry. I will also discuss plans for improving epitaxial growth via heating of the substrate during sputtering.