BYU

Abstract by James Erikson

Personal Infomation


Presenter's Name

James Erikson

Co-Presenters

None

Degree Level

Undergraduate

Co-Authors

None

Abstract Infomation


Department

Physics and Astronomy

Faculty Advisor

John Colton

Title

Conductivity Measurements in ZnO Thin-Film Semiconductors

Abstract

An understanding of the electrical properties of a sample is integral in the study of semiconductive materials. In order to fully characterize ZnO thin-film semiconductors, conductivity measurements were taken using Seebeck hot probe and Hall methods. These measurements result in understanding of the N or P type nature of the lab-grown samples, as well as a picture of the overall conductivity of the material. An explanation of the Seebeck and Hall effects is given, as well as a description of our methods involving their application. Certain troubles in measurements arising from the process of annealing samples are discussed, as well as potential solutions that have been proposed and are in the process of implementation. With the information obtained through these methods understanding of our samples is increased, and plans for future samples can be formed and adjusted.