BYU

Abstract by Colter Stewart

Personal Infomation


Presenter's Name

Colter Stewart

Co-Presenters

None

Degree Level

Undergraduate

Co-Authors

None

Abstract Infomation


Department

Physics and Astronomy

Faculty Advisor

John Colton

Title

Characterization of ZnO Thin Films by Ellipsometry

Abstract

We seek to develop stable, p-type zinc oxide for use in optical and electrical devices. By a magnetron sputtering technique, we grow ZnO films doped with zinc arsenide. We then employ ellipsometry to determine the thickness of our grown films. Preliminary measurements indicate that varying sputtering parameters during growth changes the thickness and uniformity of our films. We hope to further use these results to refine the growth process and identify the optimal parameters for fabricating p-type ZnO.