Abstract by Landon Fisher
Chemistry and Biochemistry
Instrumentation Parameters for Analyzing Surface Hydroxyls Using TOF-SIMS
Surface hydroxyls are the most important functional group on glass surfaces, influencing processes like wetting, adhesion, reactivity and contamination. Our focus is measuring surface hydroxyl concentration on multicomponent glass substrates. Time-of-flight secondary ion mass spectrometry provides the requisite sensitivity and surface sensitivity for this analytical task. However, few studies to date have used this approach, and measurement protocols are not well-established. We have examined several instrumental factors to understand their impact on measurement reproducibility. In particular, the reflector voltage in our ToF analyzer has a strong influence on our measurements. We also discuss the effects of beam damage, sample temperature at time of analysis, instrument cycle time, beam current settings, and detector saturation and their effects on mass resolution and quantitation. This careful examination of instrumental factors is a necessary prerequisite to obtaining meaningful data on glass surface hydroxyl concentration.